This simple, special mode measures large diameter targets or
wide sheet materials. Complicated calculations or other settings are unnecessary.
One measuring head allows simultaneous measurement using
two measurement modes, such as measuring the outer diameter and eccentricity.
The measuring area can be designated according to the
inspection purpose, such as measurement of the IC lead gap or pitch.
Even transparent objects that were difficult to detect with
conventional micrometers can be measured. The edge detection level can be easily changed via the controller.
The measuring head
conforms to the IP64 environmental resistance standard. Water or dust intrusion into the measuring head can be reliably prevented.
* is required information.